000 01245cam a2200337 a 4500
001 15092871
005 20160522151231.0
008 071126s2008 ne a b 001 0 eng
010 _a2007048527
015 _aGBA7A1296
_2bnb
016 7 _a014469115
_2Uk
020 _a0123695295
020 _a9780123695291
035 _a(OCoLC)ocn176924795
035 _a(OCoLC)176924795
040 _aDLC
_cDLC
_dBTCTA
_dYDXCP
_dBAKER
_dUKM
_dC#P
_dDLC
050 0 0 _aTK7874
_b.M86143 2008
082 0 0 _a621.3815
_222
_bMUK
100 1 _aMukherjee, Shubu.
_93554
245 1 0 _aArchitecture Design for Soft Errors /
_cShubu Mukherjee.
260 _aAmsterdam ;
_aBoston :
_bMorgan Kaufmann Publishers/Elsevier,
_cc2008.
300 _axxi, 337 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aIntegrated circuits
_xEffect of radiation on.
_93556
650 0 _aComputer architecture.
_93557
650 0 _aSystem design.
_93558
650 0 _93555
_aIntegrated circuits
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0805/2007048527-d.html
942 _2ddc
_cBB
999 _c11271
_d11271