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In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.

By: Contributor(s): Material type: TextTextPublication details: New York : Wiley,2001. c2001.Description: xi, 263 p. : ill. ; 25 cmISBN:
  • 0471241415 (cloth : alk. paper)
Subject(s): DDC classification:
  • 530.4275 INS
Online resources: Catalogued by: Sara
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Book - Borrowing Book - Borrowing Central Library First floor 530.4275INS (Browse shelf(Opens below)) Available 000011158
Total holds: 0

"A Wiley-Interscience publication."

Distributer: Al-Ahram

Includes bibliographical references and index.

Catalogued by: Sara

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