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		Electrical characterization of GaAs materials and devices / David C. Look. by Look, D. C Series: Design and measurement in electronic engineering Material type: Text Publication details: Chichester ; New York : Wiley,c1989. c1989 Availability: Items available for loan: Central Library (1)Call number: 621.38152LOO. Log in to add tags Add to cart (remove)
		Reliability and degradation of III-V optical devices / Osamu Ueda. by Ueda, Osamu Material type: Text Publication details: Boston : Artech House,1996 c1996 Other title: Reliability and degradation of 3-5 optical devices Reliability and degradation of three-five optical devices Availability: Items available for loan: Central Library (1)Call number: 621.3693UED. Log in to add tags Add to cart (remove)

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