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		Properties of amorphous carbon / edited by S. Ravi P. Silva. by Silva, S. R. P [editor.] INSPEC (Information service) Series: EMIS datareviews series ; no. 29 Material type: Article; Literary form: Not fiction ; Audience: Specialized; Publication details: London : INSPEC, c.2003 Availability: Items available for loan: Central Library (1)Call number: 620.193 PRO. Log in to add tags Add to cart (remove)
		Silicon wafer bonding technology : for VLSI and MEMS applications / edited by Subramanian S. Iyer, IBM microelectronics division, Hopewell Junction, USA and Andre J. Auberton-Hervé, SOITEC, France. by Iyer, Subramanian S [editor.] Auberton-Hervé, Andre J [editor.] Institution of Electrical Engineers [editor.] INSPEC. EMIS Group Series: EMIS processing series ; 1 Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Specialized; Publisher: London, United Kingdom : INSPEC, [2002]Copyright date: c2002 Online access: Table of contents only Publisher description Availability: Items available for loan: Central Library (1)Call number: 621.38152 SIL. Log in to add tags Add to cart (remove)

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