TY  - BOOK
AU  - Bai,Chunli
TI  - Scanning Tunneling Microscopy and Its Application
SN  - 3540657150 (alk. paper)
AV  - QC173.4.S94 B35 2000
U1  - 502.825 21
PY  - 2000///
CY  - Berlin, New York
PB  - Springer
KW  - Scanning tunneling microscopy
KW  - Surfaces (Physics)
KW  - Surface chemistry
N1  - Includes bibliographical references (p. 345-364) and index
UR  - http://www.loc.gov/catdir/enhancements/fy0815/99034035-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0815/99034035-t.html
ER  -