Normal view MARC view ISBD view

Computational surface and roundness metrology /

Muralikrishnan, Bala.

Computational surface and roundness metrology / Bala Muralikrishnan, Jay Raja. - 1st ed. - New York : Springer, 2008. - 263p: ill; 22cm.

Includes Index.

ISBN: 9781848002968 (hardcover : alk. paper)

LCCN: 2008930489

Subjects--Topical Terms:
Surfaces technology-Measurement.
Roundness measurement

Dewey Class. No.: 620.44 / MUR

Print
Add to your cart (remove)
Send to device
Save record
Dublin Core MARCXML MARC (Unicode/UTF-8)
More searches

Search for this title in:
Other Libraries (WorldCat) Southern NH Libraries Other Databases (Google Scholar) Online Stores (Bookfinder.com)