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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Alford, Terry L
Contributor(s): Feldman, Leonard C | Mayer, James W, 1930-
Material type: TextTextPublisher: New York, N.Y. ; London : Springer,c2007. c2007Description: xiv, 336 p. : ill. ; 25 cmISBN: 9780387292601 (hbk.); 0387292608 (hbk.); 0387292616 (e-book); 9780387292618 (e-book)Subject(s): Thin films | Nanostructured materialsDDC classification: 621.38152 Online resources: Table of contents only Catalogued By: Mahitab.
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Item type Current location Call number Status Date due Barcode Item holds
Book - Borrowing Book - Borrowing Central Library
First floor
621.38152ALF (Browse shelf) Available 000009722
Total holds: 0

Distributer: Al-Ahram.

Includes bibliographical references and index.

Catalogued By: Mahitab.

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