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Commit to quality / Patrick L. Townsend with Joan E. Gebhardt.

By: Townsend, Patrick L
Contributor(s): Gebhardt, Joan E
Material type: TextTextPublisher: New York : A Wiley Press Book, c.1986Description: xvii, 189 p. : ill. ; 24 cmISBN: 0471839531Subject(s): Quality assurance | Quality circles | Value analysis (Cost control) | | Generalities January2018DDC classification: 658.562
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658.562 TOW (Browse shelf) Available 000042895
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658.562 SUM Quality / 658.562 SUM Quality / 658.562 SUM Quality / 658.562 TOW Commit to quality / 658.562015195 MON Statistical Quality Control : 658.562015195 MON Statistical Quality Control : 658.562015195 MON Introduction to statistical quality control /

Includes bibliographical references and index.

Donation from David Kirby.

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